PV05000 - SEMI PV50 - Specification for Impurities in Polyethylene Packaging Materials for Polysilicon Feedstock StdPbc-0819 This Specification is applicable to

This Specification is applicable to plastic tape frames for 300 mm wafers

This test method uses SI units

orgで入手可能となる。初版は1996年に発行，前版は2005年3月に発行された。

metal-oxide-silicon (MOS) and CMOS technologies is included

The purpose of this Guide is (1) to define common and important specifications of magnification references which are used for calibrating magnifications of critical dimension measurement scanning electron microscopes (CD-SEMs)

PV05000 - SEMI PV50 - Specification for Impurities in Polyethylene Packaging Materials for Polysilicon Feedstock StdPbc-0819 This Specification is applicable toThis Specification is intended for the quality and the testing method of polyethylene (PE) bags. The quality of PE bags is critical as poor quality PE bags may contaminate polysilicon and cause contamination during transportation. Forming an industry consensus standard will minimize contamination, control the associated costs and improve communication between supplier and user. This Standard will cover the quality criteria and the associated test