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G05200 - SEMI G52 - 半導体リードフレームのイオン汚染物の測定のための標準測定法(提案) StdPbc-1224 The other areas are handled

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Description

The other areas are handled in other SEMI Standards Documents

and control system manufacturers

SEMI E120-1104E (editorial revision)

it has been replaced by SEMI C71

SEMI M71-0310 (technical revision)

G05200 - SEMI G52 - 半導体リードフレームのイオン汚染物の測定のための標準測定法(提案) StdPbc-1224 The other areas are handledGlobal Assembly and Packaging CommitteeJapanese Packaging Committee2004723Japanese Regional Standards Committee20049www. semi. org2004111990 Na+NH4+K+Cl NO3 Br SO42 PO43 Referenced SEMI Standards None.

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