Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices Ingestion-build-258901 – to provide substantive information

– to provide substantive information during design/development phase to show that the product offered is likely to satisfy the RAM requirements by performing detailed RAM analysis

since the purpose is to evaluate existing seams

This helps in determining the characteristics of these resistors used in electronic components

4 Procedure

— specify requirements to perform a vulnerability analysis modifying environmental factors (This is covered by ISO/IEC 19792

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices Ingestion-build-258901 – to provide substantive information